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1

Test Procedures for Proton-Induced Single Event Latchup in Space Environments

Felix, James A., Schwank, James R., Shaneyfelt, Marty R., Baggio, Jacques, Paillet, Philippe, Ferlet-Cavrois, Veronique, Dodd, Paul E., Girard, Sylvain, Blackmore, Ewart W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 131 KB

english, 2008

2

Radiation Effects in MOS Oxides

Schwank, James R., Shaneyfelt, Marty R., Fleetwood, Daniel M., Felix, James A., Dodd, Paul E., Paillet, Philippe, Ferlet-Cavrois, VÉronique

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 1.83 MB

english, 2008

3

Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains

Dodd, Paul E., Shaneyfelt, Marty R., Flores, Richard S., Schwank, James R., Hill, Thomas A., McMorrow, Dale, Vizkelethy, Gyorgy, Swanson, Scot E., Dalton, Scott M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.43 MB

english, 2011

4

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Test procedures for proton-induced single event latchup in space environments

Felix, James A., Schwank, James R., Shaneyfelt, Marty R., Baggio, Jacques, Paillet, Philippe, Ferlet-Cavrois, Veronique, Dodd, Paul E., Girard, Sylvain, Blackmore, Ewart W.

Year:

2007

Language:

english

File:

PDF, 738 KB

english, 2007

5

A microstructural investigation of model solid state hydrodesulfurization catalysts

Amit Sachdev, James Lindner, Johannes Schwank, Maria A.Villa Garcia

Journal:

Journal of Solid State Chemistry

Year:

1990

Language:

english

File:

PDF, 16.27 MB

english, 1990

6

The effect of downstream synthesis gas feeding on Fischer–Tropsch product distributions

James M. Bucher, Johannes W. Schwank

Journal:

Fuel Processing Technology

Year:

2009

Language:

english

File:

PDF, 502 KB

english, 2009

7

Syngas and HDS catalysts derived from sulphido bimetallic clusters

M.David Curtis, James E. Penner-Hahn, Johannes Schwank, Oswaldo Baralt, Daniel J. McCabe, Levi Thompson, Geoffrey Waldo

Journal:

Year:

1988

Language:

english

File:

PDF, 958 KB

english, 1988

8

The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets

Sierawski, Brian D., Warren, Kevin M., Mendenhall, Marcus H., Dodds, Nathaniel A., Clemens, Michael Andrew, Weller, Robert A., Reed, Robert A., Dodd, Paul E., Shaneyfelt, Marty R., Schwank, James R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 837 KB

english, 2011

9

Effects of Moisture on Radiation-Induced Degradation in CMOS SOI Transistors

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Hill, Tom A., Dalton, Scott M., Swanson, Scot

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 324 KB

english, 2010

10

Irradiated Silicon Gate MOS Device Bias Annealing

Schwank, James R., Dawes, William R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1983

Language:

english

File:

PDF, 859 KB

english, 1983

11

Correlation of Radiation Effects in Transistors and Integrated Circuits

Sexton, Fred W., Schwank, James R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1985

Language:

english

File:

PDF, 1.09 MB

english, 1985

12

Analysis of Proton and Heavy-Ion Irradiation Effects on Phase Change Memories With MOSFET and BJT Selectors

Gasperin, Alberto, Paccagnella, Alessandro, Schwank, James R., Vizkelethy, Gyorgy, Ottogalli, Federica, Pellizzer, Fabio

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 547 KB

english, 2008

13

Enhanced Degradation in Power MOSFET Devices Due to Heavy Ion Irradiation

Felix, James A., Shaneyfelt, Marty R., Schwank, James R., Dalton, Scott M., Dodd, Paul E., Witcher, J. Brandon

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 868 KB

english, 2007

14

Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging

Schwank, James R., Shaneyfelt, Marty R., Dasgupta, Aritra, Francis, S. A., Zhou, Xing J., Fleetwood, Daniel M., Schrimpf, Ronald D., Pantelides, Sokrates T., Felix, James A., Dodd, Paul E., Ferlet-Cav

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 886 KB

english, 2008

15

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

Heidel, David F., Marshall, Paul W., Pellish, Jonathan A., Rodbell, Kenneth P., LaBel, Kenneth A., Schwank, James R., Rauch, Stewart E., Hakey, Mark C., Berg, Melanie D., Castaneda, Carlos M., Dodd, P

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 660 KB

english, 2009

16

Influence of Beam Conditions and Energy for SEE Testing

Ferlet-Cavrois, Veronique, Schwank, James R., Liu, Sandra, Muschitiello, Michele, Beutier, Thierry, Javanainen, Arto, Hedlund, Alex, Poivey, Christian, Mohammadzadeh, Ali, Harboe-Sorensen, Reno, Santi

Journal:

IEEE Transactions on Nuclear Science

Year:

2012

Language:

english

File:

PDF, 1.10 MB

english, 2012

17

Hardness Assurance Testing for Proton Direct Ionization Effects

Schwank, James R., Shaneyfelt, Marty R., Ferlet-Cavrois, Véronique, Dodd, Paul E., Blackmore, Ewart W., Pellish, Jonathan A., Rodbell, Kenneth P., Heidel, David F., Marshall, Paul W., LaBel, Kenneth A

Journal:

IEEE Transactions on Nuclear Science

Year:

2012

Language:

english

File:

PDF, 682 KB

english, 2012

18

Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing

Shaneyfelt, Marty R., Felix, James A., Dodd, Paul E., Schwank, James R., Dalton, Scott M., Baggio, Jacques, Ferlet-Cavrois, VÉronique, Paillet, Philippe, Blackmore, Ewart W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 1.34 MB

english, 2008

19

32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches

Rodbell, Kenneth P., Heidel, David F., Pellish, Jonathan A., Marshall, Paul W., Tang, Henry H. K., Murray, Conal E., LaBel, Kenneth A., Gordon, Michael S., Stawiasz, Kevin G., Schwank, James R., Berg,

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.19 MB

english, 2011

20

Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques

Schwank, James R., Shaneyfelt, Marty R., Dodd, Paul E., McMorrow, Dale, Vizkelethy, Gyorgy, Ferlet-Cavrois, Véronique, Gouker, Pascale M., Flores, Richard S., Stevens, Jeffrey, Buchner, Stephen B., Da

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 553 KB

english, 2011

21

Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements

Schwank, James R., Shaneyfelt, Marty R., McMorrow, Dale, Ferlet-Cavrois, Véronique, Dodd, Paul, Heidel, David F., Marshall, Paul W., Pellish, Jonathan A., LaBel, Kenneth A., Rodbell, Kenneth P., Hakey

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 549 KB

english, 2010

22

Heavy-Ion Induced Charge Yield in MOSFETs

Javanainen, Arto, Schwank, James R., Shaneyfelt, Marty R., Harboe-Sorensen, Reno, Virtanen, Ari, Kettunen, H., Dalton, Scott M., Dodd, Paul E., Jaksic, Aleksandar B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 490 KB

english, 2009

23

Radiation Response and Variability of Advanced Commercial Foundry Technologies

Felix, James A., Dodd, Paul E., Shaneyfelt, Marty R., Schwank, James R., Hash, Gerald L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 420 KB

english, 2006

24

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

Heidel, David F., Marshall, Paul W., LaBel, Kenneth A., Schwank, James R., Rodbell, Kenneth P., Hakey, Mark C., Berg, Melanie D., Dodd, Paul E., Friendlich, Mark R., Phan, Anthony D., Seidleck, Christ

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 565 KB

english, 2008

25

Proton-Induced Upsets in SLC and MLC NAND Flash Memories

Bagatin, Marta, Gerardin, Simone, Paccagnella, Alessandro, Ferlet-Cavrois, Veronique, Schwank, James R., Shaneyfelt, Marty R., Visconti, Angelo

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 571 KB

english, 2013

26

Distribution of selected healthcare resources for influenza pandemic response in Cambodia

Schwanke Khilji, Sara U, Rudge, James W, Drake, Tom, Chavez, Irwin, Borin, Khieu, Touch, Sok, Coker, Richard

Journal:

International Journal for Equity in Health

Year:

2013

Language:

english

File:

PDF, 687 KB

english, 2013

27

Semi-Empirical Model for SEGR Prediction

Javanainen, Arto, Ferlet-Cavrois, Veronique, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., Virtanen, Ari

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.04 MB

english, 2013

28

SEGR in SiO${}_2$ –Si$_3$ N$_4$ Stacks

Javanainen, Arto, Ferlet-Cavrois, Veronique, Bosser, Alexandre, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., V

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 870 KB

english, 2014

29

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Heavy ion testing at the galactic cosmic ray energy peak

Pellish, Jonathan A., Xapsos, Michael A., LaBel, Kenneth A., Marshall, Paul W., Heidel, David F., Rodbell, Kenneth P., Hakey, Mark C., Dodd, Paul E., Shaneyfelt, Marty R., Schwank, James R., Baumann,

Year:

2009

Language:

english

File:

PDF, 153 KB

english, 2009

30

Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Felix, James A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 1.50 MB

english, 2008

31

Modeling of Heavy Ion Induced Charge Loss Mechanisms in Nanocrystal Memory Cells

Cester, Andrea, Wrachien, Nicola, Schwank, James R., Vizkelethy, Gyorgy, Portoghese, Rosario, Gerardi, Cosimo

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 788 KB

english, 2008

32

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements

Schwank, James R., Shaneyfelt, Marty R., McMorrow, Dale, Ferlet-Cavrois, Veronique, Dodd, P. E., Heidel, David F., Marshall, Paul W., Pellish, Jonathan A., LaBel, Kenneth A., Rodbell, Kenneth P., Hake

Year:

2009

Language:

english

File:

PDF, 879 KB

english, 2009

33

[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - SOI substrate removal for SEE characterization: Techniques and applications

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Stevens, Jeffrey, Vizkelethy, Gyorgy, Swanson, Scot E., Dalton, Scott M.

Year:

2011

Language:

english

File:

PDF, 1.10 MB

english, 2011

34

Implications of Characterization Temperature on Hardness Assurance Qualification

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Hash, Gerald L., Paillet, Philippe, Felix, James A., Baggio, Jacques, Ferlet-Cavrois, Veronique

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 272 KB

english, 2006

35

[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Hardness assurance testing for proton direct ionization effects

Schwank, James R., Shaneyfelt, Marty R., Ferlet-Cavrois, Veronique, Dodd, Paul E., Blackmore, Ewart W., Pellish, Jonathan A., Rodbell, Kenneth P., Heidel, David F., Marshall, Paul W., LaBel, Kenneth A

Year:

2011

Language:

english

File:

PDF, 869 KB

english, 2011

36

An Embeddable SOI Radiation Sensor

Shaneyfelt, Marty R., Hill, Tom A., Gurrieri, Thomas M., Schwank, James R., Flores, Richard S., Dodd, Paul E., Dalton, Scott M., Robinson, Alex

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 804 KB

english, 2009

37

Heavy Ion Testing With Iron at 1 GeV/amu

Pellish, Jonathan A., Xapsos, Michael A., LaBel, Kenneth A., Marshall, Paul W., Heidel, David F., Rodbell, Kenneth P., Hakey, Mark C., Dodd, Paul E., Shaneyfelt, Marty R., Schwank, James R., Baumann,

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 603 KB

english, 2010

38

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

Pellish, Jonathan A., Marshall, Paul W., Rodbell, Kenneth P., Gordon, Michael S., LaBel, Kenneth A., Schwank, James R., Dodds, Nathaniel A., Castaneda, Carlos M., Berg, Melanie D., Kim, Hak S., Phan,

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 755 KB

english, 2014

39

Radiation Effects in 3D Integrated SOI SRAM Circuits

Gouker, Pascale M., Tyrrell, Brian, D'Onofrio, Richard, Wyatt, Peter, Soares, Tony, Hu, Weilin, Chen, Chenson, Schwank, James R., Shaneyfelt, Marty R., Blackmore, Ewart W., Delikat, Kelly, Nelson, Mar

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.35 MB

english, 2011

40

Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs

Schwank, James R., Shaneyfelt, Marty R., Dodd, Paul E., McMorrow, Dale, Warner, Jeffrey H., Ferlet-Cavrois, Véronique, Gouker, Pascale M., Melinger, Joseph S., Pellish, Jonathan A., Rodbell, Kenneth P

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 990 KB

english, 2011

41

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Elimination of Enhanced Low-Dose-Rate Sensitivity in Linear Bipolar Devices Using Silicon-Carbide Passivation

Shaneyfelt, Marty R., Maher, Michael C., Camilletti, Robert C., Schwank, James R., Pease, Ronald L., Russell, Brian A., Dodd, Paul E.

Year:

2005

Language:

english

File:

PDF, 8.27 MB

english, 2005

42

The Effect of High-Z Materials on Proton-Induced Charge Collection

Clemens, Michael Andrew, Hooten, Nicholas C., Ramachandran, Vishwa, Dodds, Nathaniel A., Weller, Robert A., Mendenhall, Marcus H., Reed, Robert A., Dodd, Paul E., Shaneyfelt, Marty R., Schwank, James

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 863 KB

english, 2010

43

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Effects of moisture on radiation-induced degradation in CMOS SOI transistors

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Hill, Tom A., Dalton, Scott M., Swanson, Scot E.

Year:

2009

Language:

english

File:

PDF, 220 KB

english, 2009

44

[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - SEGR in SiO2-Si3N4 stacks

Javanainen, Arto, Ferlet-Cavrois, Veronique, Bosser, Alexandre, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., V

Year:

2013

Language:

english

File:

PDF, 784 KB

english, 2013

45

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Moisture Effects on the 1/F Noise Of Mos Devices

Fleetwood, Daniel M., Francis, Sarah A., Dasgupta, Aritra, Zhou, Xing, Schrimpf, Ronald, Shaneyfelt, Marty R., Schwank, James R.

Year:

2009

Language:

english

File:

PDF, 598 KB

english, 2009

46

Comments by the Editors

Schwank, James R., Buchner, Stephen, Marshall, Paul, Duzellier, Sophie, Brown, Dennis, Poivey, Christian, Pease, Ron, Girard, Sylvain

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 24 KB

english, 2009

47

Comments by the Editors

Schwank, James, Marshall, Paul, Brown, Dennis

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 21 KB

english, 2011

48

Comments by the Editors

Schwank, James R., Felix, James A., Buchner, Stephen, Marshall, Paul, Duzellier, Sophie, Brown, Dennis, Poivey, Christian, Pease, Ronald L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 21 KB

english, 2008

49

Comments by the Editors

Schwank, James R., Paillet, Philippe, Felix, James A., Buchner, Stephen, Marshall, Paul, Duzellier, Sophie, Brown, Dennis

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 21 KB

english, 2007

50

SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Optics in Agriculture, Forestry, and Biological Processing - Knowledge-based object recognition for different morphological classes of plants

Brendel, Thorsten, Schwanke, Joerg, Jensch, Peter F., Megnet, Roland, Meyer, George E., DeShazer, James A.

Year:

1995

Language:

english

File:

PDF, 325 KB

english, 1995

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